题 目: OTA Testing Methods and Best Practices 报告人： Dr. Yihong Qi 时 间： 2015年10月16日（周五）下午14：00-15：30 地 点： 江宁开发区，秣周东路9号，无线谷A3楼3412会议室 主 办： 东南大学毫米波国家重点实验室 IEEE AP-MTT-EMC Joint Nanjing Chapter 江苏省电子学会天线与微波专委会 内容简介： 报告人简介： Yihong Qi（漆一宏） (M’92-SM’11) received the B.S. degree in electronics from the National University of Defense Technologies, Changsha, China, the M.S. degree in electronics from the Chinese Academy of Space Technology , Beijing, China, and the Ph.D. degree in electronics from Xidian University, Xi’an, China. From 1989 to 1993, he was a Postdoctoral Fellow and then an Associate Professor with Southeast University, Nanjing, China. From 1993 to 1995, he was a Postdoctoral Researcher at McMaster University, Hamilton, ON, Canada. From 1995 to 2010, he was with Research in Motion, Waterloo, ON, where he was the Director of advanced electromagnetic research. He is the founder and Chief Scientist in General Test System Inc., he founded DBJay in 2011. He is an Adjunct Professor in the Missouri University of Science and technology EMC Laboratory, Rolla, MO, USA, and an Adjunct Professor in Hunan University, Changsha. He is an Inventor of 195 published and pending US patents. Dr. Qi is a Distinguished Lecturer of the IEEE EMC Society for 2014 and 2015 and he founded and serves as a Chairman of the IEEE EMC TC12. | ||
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